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The following instruments are available:


STRESS-SPEC: View of instrument

[ Photo: Astrid Eckert / TUM]

for stress, texture, or phase analysis

Contact: Dr. Weimin Gan


Sans-1: Look into the detector tube

[Photo: Sebastian Mast]

for studies of the nanostructure of bulk samples

Contact: Dr. André Heinemann


Refsans instrument

[Photo: Wenzel Schürmann / TUM]

for studies of nanostructures at interfaces

Contact: Dr. Jean-François Moulin

Materials Science Lab

for sample preparation and complementary characterisation

Contact: Armin Kriele

The most important methods:

• Diffraction – strain analysis

For measurements of stresses in the interior of materials and components.

• Diffraction – texture measurements

For measurements of crystallographic textures.

• Diffraction – phase analysis

For the quantitative determination of the phase composition of a material.

• Small-Angle Neutron Scattering (SANS)

For the analysis of nanostructures in the bulk, e.g. precipitates.

• Neutronen-reflectometry and small-angle scattering under grazing incidence (GISANS)

For the analysis of nanostructuires at interfaces, e.g. coatings.