Techniques and Equipment
| Equipment | Specification and application |
| MTS XP (KLA Tencor) Nanoindenter | For nano- und micromechanical test at room temperature. Available options: CSM, DCM and HL. Max. load = 10N. |
| Hystron/Bruker TI980 Nanoindenter | For nano- und micromechanical tests at room/elevated temperature (up to 600°C), Available options: NanoDMA, MultiRange nanoProbe, xProbe, SPM imaging, XPM, Acoustic emission. Max. load = 3N. |
| Deben Mikrotest | For mikromechanical Ex-situ- and In-situ-SEM tests at room temperature. Available options: tension, compression, 4 point bending, EBSD setup mounts. Max. load = 200N. |
| ThermoFischer Nanolab 200 Zweistrahlmikroskop (SEM/FIB) | For microstructural characterization and milling with Ga. Available detectors/methods: EBSD, EDS, TLD, Omniprobe, Nanomechanics Inc. In-situ nanoindenter. |
| ThermoFischer Helios G4 UXe PFIB Zweistrahlenmikroskop (SEM/FIB) | For microstructural characterization and milling with Plasma. Available detectors/methods: EBSD, EDS, TLD, STEM, BS, |
| Bruker PI95 TEM picoindenter | For in-situ mechanical testin inside a TEM |
| KLA NanoFlip | For in-situ mechanical testing inside an SEM |
Also there is a direct access to a Talos F200i equipped with EFTEM/EELS, EDX and STEM detectors and the Hysitron/Bruker in situ nanoindenter TI980. Other instruments include SAXS/WAXS and Zeiss Ultra Nanotomography.