Methods
Equipment
The Department Micro-/Nanotechnology applies numerous processing and surface technologies as well as different methods for surface and interface characterization, various electron microscopy techniques as well as thermal and mechanical testing methods for the investigation of multifunctional polymeric materials.
- Extrusion
- Injection moulding
- Electrospinning/ Electrospraying
-
Extrusion: Single screw extruder HAAKE PolyLab Rheomex ES, 18 mm (Thermo Scientific) -
Extrusion: Single screw extruder, Gimac 14mm (Gimac di Maccagnan Giorgio) -
Extrusion: Single screw extruder, a vacuum water bath with fiber calibration unit, tape stripping with cutting unit (Extrudex) -
Extrusion: Twin screw extruder, Prism Lab 16 mm (Thermo Scientific) -
Extrusion: Twin screw extruder, 2 dosing unit with forced dosing (Coperion) -
Extrusion: HAAKE Minilab, Twin screw extruder equal and opposite rotating barrels (Thermo Scientific) -
Extrusion: UV/ VIS und NIR inline analytic system (Sentronic) -
Injection moulding: HAAKE Minijet, piston injection molding system (Thermo Scientific) -
Injection moulding: Arburg Allrounder 270 U 250-70, column spacing: 270 x 270 mm, clamping force: 250 kN, injection unit EUROMAP: 70 (Arburg) -
Electrospinning/ Electrospraying: Electrospinning machine consisting of starter Kit with rotating collector (Linari Engineering, Biomedical Division)
Spin coating
Spin coater WS-650SZ-6NPP/ A1/ AR1 (Laurell Technologies Co.)
Monolayer preparation
Langmuir trough system (KSV NIMA)
Plasmabehandlung
Plasma treatment plant, Plaslan 50, 2.45 GHz microwave, max. 2kW, sample size up to 400 mm energy pulsable (0-10 kHz in asymmetric cycles), sample treatment outside the plasma zone, temperature controlled sample holder (5 ° C to 80 ° C), automatic pressure control system (JE PlasmaConsult)
- Contact Angle Measurement
- Ellipsometry
- Profilometry
- Streaming potential measurements
- Porosimetry
- Computed tomography (µCT)
- X-ray photoelectron spectroscopy
-
Contact angle measurement: Drop contour gauge, DSA 100, Measurement of contact angles with sessile drop and captive bubble method, determination of surface tensions, Accessories: High temperature unit up to 400 ° C (Krüss) -
Contact angle measurement: Tensiometer, K 100 MK3, Measurement of contact angles, surface and interfacial tensions, Accessories: sample holder for determination of sedimentation, sample holder for penetration measurements (Krüss) -
Ellipsometry: Spectroscopic ellipsometer SE 800 (SENTECH Instruments) -
Ellipsometry: Spectroscopic ellipsometer Nanofilm EP4 (Accurion) -
Profilometry: Optical profilometer MicroProf 200, Resolution in z: 10 nm, measurement accuracy: 0.1 microns, lateral resolution of 2.5 microns (Fries Research & Technology) -
Streaming potential measurements: MES microslit electrokinetic setup including micro-gap cell and measuring cells for planar samples, powder and fibers (ZetaScience GmbH) -
Porosimetry: Mercury porosimeter PASCAL 140-440, measurement of pore radii in the range of 58 microns to 1.8 nm and particle diameters of 300 nm to 0.1 microns (POROTEC) -
Computed tomography system (µCT): CT compact, X-ray source (150 kV) Analyzer (1024 * 1024 pixels, resolution 5 microns) , temperature controlled sample holder (0 ° C to 80 ° C) (Procon X-ray) -
X-ray photoelectron spectroscopy: XPS, X-ray photoelectron spectrometer, Axis Ultra Monochromator (Al), dual source (Al, Mg), UPS Ion source for surface treatment (Ar-mode, PAH-mode) , scanning electron microscope, temperature-controlled sample holder (-50 ° C to 250 ° C) (Kratos)
- Digital microscopy
- Scanning force microscopy
- Scanning electron microscopy
- Transmission electron microscopy
- Preparation techniques
-
Digital microscopy: Portable digital microscope VHX 100 (Keyence) -
Scanning force microscopy: NanoScope V, Accessories: bioheater, ceater/cooler System, fluid cell contact mode/ tapping mode, electric force mode, torsion mode (Veeco) -
Rasterkraftmikroskopie: Accessories: Nanoindenter, bioheater, cooler/heater, petrie dish heater, ztherm, humidy sensing cell, closed-fluid-cell, inverse light microscope Zeiss Observer Z1 (Asylum Research, Oxford Instruments) -
Scanning electron microscopy: Environmental scanning electron microscope ESEM, FEI Quanta FEG 250 including EDX X-ray analysis (EDAX) -
Scanning electron microscopy: Scanning electron microscope Zeiss Gemini Supra 40 VP including EDX X-ray analysis (EDAX) -
Scanning electron microscopy: Benchtop scanning electron microscope Phenom G2 pro (LOT) -
Transmission elekctron microskopy: Benchtop transmission electron microscope, LVEM5, (Delong Instruments) -
Preparation techniques: Critical-point dryer, Polaron CD 7501 (Gala Instruments) -
Preparation techniques: Sputter coater, Quorum Q 150 T ES (Gala Instruments) -
Preparation techniques: Cryo ultra microtome EM UC6 and EM FC (Leica) -
Preparation techniques: Freeze-fracture system, EM BAF 060 (Leica)
Tensile testing
Tensile tester
model 3345
(Instron)
Melt flow index
HAAKE MeltFlow MT
(Thermo Scientific)
Thermo mechanical analysis
TMA 402 Hyperion F3
investigation of thermo-mechanical properties
Measuring range: 0.001 to N ± 3 N in 0.2 mN steps
(NETSCH)
Thermal conductivity measurement
Laser flash analysis LFA 447
measurement of temperature and heat conductivity
measuring range: temperature conductivity: 0.01 mm2 / s to 1000 mm2 / s
measuring range: heat sonductivity: <0.1 W / (mK) and 2000 W / (mK)
(NETSCH)