Scanning electron microscope examinations

Material characterization with the scanning electron microscope

Material characterization with the scanning electron microscope, material analysis with energy dispersive X-ray spectroscopy (EDX), material analysis with electron backscatter diffraction (EBSD)

Material characterization with the scanning electron microscope is a standard analytical technique in material development. Structural properties of the material microstructure can be visualized using various examination methods and contrasts. The Department of Metal Physics has a modern scanning electron microscope from TESCAN (built in 2024) with connected analytics for EDX and EBSD from Oxford.